A Radiation Hardened Mutually Compensated Mobility and Threshold Voltage Reference Approach.

Nugent, Brian.

2012

Description
  • Abstract: Microelectronics that leave the earth's magnetosphere are exposed to the natural radiation environment and are subject to effects not experienced by terrestrial microelectronics. Device characteristic degradation including off state leakage current, reduced transconductance, and reduced threshold voltage are all potential consequences of being exposed to the natural radiation environ... read more
This object is in collection Corporate name Permanent URL
ID:
h702qj89m
Component ID:
tufts:20954
To Cite:
DCA Citation Guide    EndNote