Photoluminescence Based Semiconductor Defect Detection.

Rockmore, Robert S.


  • Abstract: In this thesis, a characterization system for semiconductor materials was designed, fabricated, and tested. The capabilities of this setup include measuring photoluminescence emission at a single location of a sample, as well as performing spatially resolved “micro-photoluminescence” measurements throughout a region on the surface of the sample. A number of Gallium Arsenide semicondu... read more
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