Dielectric Permittivity Measurements of Thin Films at Microwave and Terahertz Frequencies.

Chao, Liu.

2017-04-19T12:48:55.218Z

Description
  • Abstract: This thesis focuses on the complex dielectric characterizations of thin film materials using the state-of-the-art methods at microwave wavelengths and terahertz frequencies. Several methods are developed and employed. Thin film materials are already used in a variety of microwave and higher frequency applications such as electrically tunable microwave devices, integrated circuits like MM... read more
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