PDF | Characterization of Neural Scaffolds by Atomic Force Microscopy. | ID: 2j62sh45g | Tufts Digital Library

Characterization of Neural Scaffolds by Atomic Force Microscopy.

Riley, Peter.

2016

B56453655?file=thumbnail

open in viewer

This object is in collection

Tufts University. Summer Scholars Program.

Corporate name

Tufts University. Department of Physics and Astronomy.

Permanent URL

http://hdl.handle.net/10427/015219

ID:: 2j62sh45g
To Cite:: DCA Citation Guide EndNote
Usage:: Detailed Rights

Go to tufts.edu

© 2021 Tufts University