Photoluminescence Based Semiconductor Defect Detection.

Rockmore, Robert S.
2014

Abstract: In this thesis, a characterization system for semiconductor materials was designed, fabricated, and tested. The capabilities of this setup include measuring photoluminescence emission at a single location of a sample, as well as performing spatially resolved “micro-photoluminescence” measurements throughout a region on the surface of the sample. A numb... read more

This object is in collection:
Undergraduate Honors Theses
Subjects
Senior honors thesis.
Tufts University. Department of Physics and Astronomy.
Semiconductors.
Solar cells.
Photovoltaic power generation.
Permanent URL
http://hdl.handle.net/10427/002018
ID: tufts:sd.0000175
To Cite: DCA Citation Guide
Usage: Detailed Rights