Sparse view Compton scatter tomography with energy resolved data: experimental and simulation results.Desmal, Abdulla.
Tracey, Brian H.
Miller, Eric L.
Schubert, Jeffrey R.
X-ray inspection systems play a critical role in many non-destructive testing and security applications, with systems typically measuring attenuation during transmission along straight-line paths connecting sources and detectors. Computed tomography (CT) systems can provide higher-quality images than single- or dual-view systems, but the need to measure many projections through the scene increases... read more
- Conference proceedings.
- Tufts University. Department of Electrical and Computer Engineering.
- Permanent URL
- Original publication
- Abdulla Desmal, Brian H. Tracey, Hamideh Rezaee, Eric L. Miller, Jeffrey R. Schubert, Jeff Denker, Aaron Couture, "Sparse view Compton scatter tomography with energy resolved data: experimental and simulation results", Proc. SPIE 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II, 1018707 (1 May 2017); doi: 10.1117/12.2266688; http://dx.doi.org/10.1117/12.2266688