Sparse view Compton scatter tomography with energy resolved data: experimental and simulation results.

Desmal, Abdulla.
Tracey, Brian H.
Rezaee, Hamideh.
Miller, Eric L.
Schubert, Jeffrey R.
Denker, Jeff.
Couture, Aaron.
2017.

X-ray inspection systems play a critical role in many non-destructive testing and security applications, with systems typically measuring attenuation during transmission along straight-line paths connecting sources and detectors. Computed tomography (CT) systems can provide higher-quality images than single- or dual-view systems, but the need to measure many projections through the scene increases... read more

Subjects
Detectors.
Photons.
Tomography.
Conference proceedings.
Tufts University. Department of Electrical and Computer Engineering.
Permanent URL
http://hdl.handle.net/10427/013341
Original publication
Abdulla Desmal, Brian H. Tracey, Hamideh Rezaee, Eric L. Miller, Jeffrey R. Schubert, Jeff Denker, Aaron Couture, "Sparse view Compton scatter tomography with energy resolved data: experimental and simulation results", Proc. SPIE 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II, 1018707 (1 May 2017); doi: 10.1117/12.2266688; http://dx.doi.org/10.1117/12.2266688
ID: tufts:22787
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