Robust x-ray based material identification using multi-energy sinogram decomposition.Yuan, Yaoshen.
Tracey, Brian H.
Miller, Eric L.
There is growing interest in developing X-ray computed tomography (CT) imaging systems with improved ability to discriminate material types, going beyond the attenuation imaging provided by most current systems. Dual- energy CT (DECT) systems can partially address this problem by estimating Compton and photoelectric (PE) coefficients of the materials being imaged, but DECT is greatly degraded by t... read more
- Conference proceedings.
- Tufts University. Department of Electrical and Computer Engineering.
- Permanent URL
- Original publication
- Yaoshen Yuan, Brian Tracey, Eric Miller, "Robust x-ray based material identification using multi-energy sinogram decomposition", Proc. SPIE 9847, Anomaly Detection and Imaging with X-Rays (ADIX), 98470V (12 May 2016); doi: 10.1117/12.2222584; http://dx.doi.org/10.1117/12.2222584