Robust x-ray based material identification using multi-energy sinogram decomposition.

Yuan, Yaoshen.
Tracey, Brian H.
Miller, Eric L.
2016.

There is growing interest in developing X-ray computed tomography (CT) imaging systems with improved ability to discriminate material types, going beyond the attenuation imaging provided by most current systems. Dual- energy CT (DECT) systems can partially address this problem by estimating Compton and photoelectric (PE) coefficients of the materials being imaged, but DECT is greatly degraded by t... read more

Subjects
Detectors.
Photons.
Conference proceedings.
Tufts University. Department of Electrical and Computer Engineering.
Permanent URL
http://hdl.handle.net/10427/013340
Original publication
Yaoshen Yuan, Brian Tracey, Eric Miller, "Robust x-ray based material identification using multi-energy sinogram decomposition", Proc. SPIE 9847, Anomaly Detection and Imaging with X-Rays (ADIX), 98470V (12 May 2016); doi: 10.1117/12.2222584; http://dx.doi.org/10.1117/12.2222584
ID: tufts:22786
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