3D Localization Algorithms for Industrial Few-View X-ray CT Imaging Systems.Foley, Jonathan.
Abstract: Future airport security goals as proposed by the Transportation Safety Administration impose two intrinsically opposing requirements on X-ray scanners, namely high resolution imaging and high throughput speeds. Modern few-view scanners offer a first step towards these goals, offering better resolution than current single-view scanners while maintaining current throughput. This thesis pro... read more
- Tufts University. Department of Electrical and Computer Engineering.
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