Dielectric Permittivity Measurements of Thin Films at Microwave and Terahertz Frequencies.

Chao, Liu.
2017-04-19T12:48:55.218Z

Abstract: This thesis focuses on the complex dielectric characterizations of thin film materials using the state-of-the-art methods at microwave wavelengths and terahertz frequencies. Several methods are developed and employed. Thin film materials are already used in a variety of microwave and higher frequency applications such as electrically tunable microwave devices, integrated circuits like MM... read more

Subjects
Tufts University. Department of Electrical and Computer Engineering.
Permanent URL
http://hdl.handle.net/10427/011615
ID: tufts:21090
To Cite: DCA Citation Guide