Dielectric Permittivity Measurements of Thin Films at Microwave and Terahertz Frequencies.

Chao, Liu.

Abstract: This thesis focuses on the complex dielectric characterizations of thin film materials using the state-of-the-art methods at microwave wavelengths and terahertz frequencies. Several methods are developed and employed. Thin film materials are already used in a variety of microwave and higher frequency applications such as electrically tunable microwave devices, integrated circuits like MM... read more

Tufts University. Department of Electrical and Computer Engineering.
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ID: tufts:21090
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