A Radiation Hardened Mutually Compensated Mobility and Threshold Voltage Reference Approach.

Nugent, Brian.

Abstract: Microelectronics that leave the earth's magnetosphere are exposed to the natural radiation environment and are subject to effects not experienced by terrestrial microelectronics. Device characteristic degradation including off state leakage current, reduced transconductance, and reduced threshold voltage are all potential consequences of being exposed to the natural radiation environment... read more

Tufts University. Department of Electrical and Computer Engineering.
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ID: tufts:20954
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